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Beilstein J. Nanotechnol. 2017, 8, 296–303, doi:10.3762/bjnano.8.32
Figure 1: AFM height images of the COOH-SAM (a) and the PEL (b).
Figure 2: AFM topography images of the ZnO films deposited onto COOH-terminated SAM (a) and PEL (d) after 3 d...
Figure 3: X-ray diffractograms of ZnO films deposited on carboxylate-SAM (black) and PEL (grey). The enhanced...
Figure 4: PFM amplitude 1 images obtained by applying voltages of 2 to 10 V of the deposited films on COOH-SA...
Figure 5: Cross-sections of the amplitude 1 images taken at 10 V for ZnO films deposited on COOH-SAM (black) ...
Figure 6: Quantitative analysis of the piezoelectric responses of ZnO films deposited on carboxylate-SAM (a) ...
Beilstein J. Nanotechnol. 2016, 7, 102–110, doi:10.3762/bjnano.7.12
Scheme 1: a) Structural formula of the α-methyl-ω-p-vinyl-benzoate-polystyrene molecule. b) Schematic represe...
Figure 1: AFM height images and corresponding cross sections of a) a Si wafer and b) a PS brush.
Figure 2: ζ-potential of the Si wafer and the PS brush before and after modification measured in water.
Scheme 2: Mechanism of the proposed transesterification process, which modifies the polystyrene brush in the ...
Figure 3: ATR spectra of PS powder used for the preparation of the brushes before and after modification. The...
Figure 4: XRD diagrams of ZnO films deposited on a) SiOx and b) PS brushes after 20 mineralization cycles. Th...
Figure 5: a) AFM topography and cross section of ZnO islands deposited on SiOx after 20 mineralization cycles...
Beilstein J. Nanotechnol. 2015, 6, 1763–1768, doi:10.3762/bjnano.6.180
Figure 1: Self-assembly of ZnO-containing material on prepatterned substrates. (a) Schematic representation o...
Figure 2: Deposition mechanism of mineralized ZnO nanoparticles on amino SAMs. The negative charges represent...